IRELEC proposes innovative solutions for non destructive quantitative analysis of trace elements using grazing incidence X-ray fluorescence.
The distinguishing advantages of this system are:
a very low detection level;
a large panel of detectable elements;
a short analysis time;
a large analysis area.
Thanks to additional expertise skills in robotics, nanopositioning and instrumentation in constrained environment, IRELEC proposes a flexible integration of its XRF measuring station in various environments and/or combined with high throughput processes.