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Surface inspection by X-Ray fluorescence

IRELEC proposes innovative solutions for non destructive quantitative analysis of trace elements using grazing incidence X-ray fluorescence.

The distinguishing advantages of this system are:

  • a very low detection level;
  • a large panel of detectable elements;
  • a short analysis time;
  • a large analysis area.

Thanks to additional expertise skills in robotics, nanopositioning and instrumentation in constrained environment, IRELEC proposes a flexible integration of its XRF measuring station in various environments and/or combined with high throughput processes.


High throughput automated process for surface inspection by XRF in clean environmentX-ray fluorescence spectrometer