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Synchrotron beamline
Optical systems

Outstanding and finely tuneable X-ray optical systems.

Synchrotron beamline: optical systems - IRELEC

Synchrotron beamline
Optical systems

Outstanding and finely tuneable X-ray optical systems.

Synchrotron beamline: optical systems - IRELEC

IRELEC offers a wide range of opto-mechanical systems for soft and hard x-ray beamlines, of which the distinguished performance contributes to matching the continuously enhanced requirements of last generation light sources. 

IRELEC has been one of the major worldwide suppliers of opto-mechanical systems at Synchrotron facilities since the early 90’s with the construction of the first ESRF beamlines

The intrinsic high performance and fine tunability of IRELEC systems are both decisive advantages for beamline managers, allowing them to get the best possible x-ray beam (stability, dimension, shape and homogeneity) sustainably, and they are easy to commission.

IRELEC's offer covers white, pink or monochromatic beams and also includes the production of nano-focused beams.

In addition to a comprehensive offer of high performance Synchrotron mirror systems, IRELEC also provides diffractive optical systems: 

  • Laue monochromator
  • In a specific agreement, IRELEC supplied a third-party Synchrotron with a Bragg & Laue polychromator, as per ESRF design (ID24 Energy Dispersive X-ray Absorption Spectroscopy beamline).

IRELEC's products for Synchrotron beamline: Optical systems

Complete mirror systems

  • White beam cooled M1 mirrors
  • Switch mirror systems
  • Harmonic Rejection Mirrors

Compact KB systems

  • Focal distance < 150 mm
  • Nano-focusing capabilities
  • UHV compliant

Custom KB systems

  • Variable mirror length up to 1.5 m
  • Designed to match the beamline optical layout
  • UHV compliant

Mechanical benders

  • Elliptical profiles < 100 nrad rms
  • Absolute bending encoders
  • Anti-twist configuration

Mirror shape compensators

  • Mirror shape correction < 1 nm rms
  • Manual or motorized
  • Calibration with optical metrology