Knowledge Base

https://www.irelec-alcen.com/wp-content/uploads/2025/08/PXL_20241219_145131982-1024x576.jpg
Knowledge Base

Determination of a reliable metrology method to characterize a sphere of confusion in the hundred nanometre range

https://www.irelec-alcen.com/wp-content/uploads/2024/07/IRELEC-Home-1024x778.webp
Knowledge Base

Accuracy in Action: How Robots Learn and Perform Tasks

https://www.irelec-alcen.com/wp-content/uploads/2024/07/Article-2_photo-1-1024x683.webp
Knowledge Base

Synchrotrons: Robotic Sample Handlers Support Advanced Macromolecular Crystallography 

https://www.irelec-alcen.com/wp-content/uploads/2024/07/Custom_KB_systems_titre_H3_photo_5-1024x683.webp
Knowledge Base

Focusing Optics at Synchrotron X-ray Beamlines: Polish-to-Shape Mirror vs. Bent Mirror