Robotic systems to handle and move the detector accurately can help diffraction beamlines minimize downtime, save time setting up experiments, get a clearer picture of the conditions of an experiment, and make experiments more secure.

IRELEC’s robotic detector handling system is designed to deliver the best possible absolute positioning of the detector for optimal observation of diffraction patterns. And, with a full-sphere range of motion around the sample, our robots can help identify the diffraction direction of interest before collecting high-resolution diffraction patterns from the desired angle and as far away from the sample as possible.

Example of the design and manufacture of a PtychoProbe Detector Mover for a Ptychography and x-ray fluorescence Microscopy Beamline.

The PtychoProbe is a new x-ray microscope being built to take advantage of the last generation Synchrotrons brightness and coherence. The PtychoProbe will focus the x-rays to be able to rapidly scan samples. Ptychography and x-ray fluorescence will be combined to for rapid acquisition of very high spatial resolution along with chemical information.

Rapid data acquisition necessitates a fast detector. Fast detectors need to have a small sensor for rapid data transfer and be close to the sample to capture the cone of diffracted x-rays. However, the highest spatial resolution data is best obtained with a larger detector, farther away from the sample. These conflicting needs require the PtychoProbe to have two detectors, easily switchable, located in one detector positioning system.